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The profiles of light-induced charge gratings on photorefractive Bi₁₂SiO₂₀ crystals are directly observed by electrostatic force imaging with an atomic force microscope. We investigate the temporal evolution of the profiles during grating formation and the dependence of the profiles of saturated gratings on the fringe spacing and the modulation index of the light grating. In the case of saturated gratings, the profiles are well described by a simple theoretical model.
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Soergel et al. (1999) studied this question.
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