Line-profile simulation and matching on the basis of a paracrystalline one-dimensional Hosemann model provides a promising approach to the analysis of line broadening. Results of analysis using X-ray wide-angle data of polymers and metallic samples are compared with Warren–Averbach multiple-order and single-order methods. Various column-length-distribution functions are also used for better agreement with the experimental profiles.
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Somashekar et al. (1997) studied this question.