Multiferroic BiFeO3∕Bi3.25Sm0.75Ti2.98V0.02O12 double-layered thin films on Pt∕Ti∕SiO2∕Si were fabricated using the pulsed-laser deposition technique. The films showed greatly enhanced ferroelectric and ferromagnetic properties. The values of the remanent polarization (2Pr) and coercive field (Ec) were 71.8μC∕cm2 and 148kV∕cm at a maximum applied voltage of 13V, respectively. The value of the magnetic moment was found to be 17.5emu∕cm3. The enhancement of the polarization originated from the BiFeO3 with Bi3.25Sm0.75Ti2.98V0.02O12 working as a barrier layer. The enhancement of the magnetization is from the structural distortion of BiFeO3, due to partial epitaxial growth on the bismuth titanate surface.
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Cheng et al. (2006) studied this question.
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