Answers are grounded in this paper and cite their sources.
This review is devoted to an analysis of the processes determining the structure of the resistive state of films whose width is larger than the penetration depth λ┴ , the form of current–voltage characteristic, critical currents, hysteresis loops of different origin, nonlinearities of the dynamic mixed state, and the formation of phase slip lines. The distribution of potentials of pairs and quasiparticles along phase-slip lines, interaction between such lines, and peculiarities of vortex dynamics in the region of charge disbalance are also considered. Phase-slip centers in narrow superconducting channels and the interaction of films with microwave fields are mentioned briefly. The available results on HTS materials as well as visual information obtained with the help of low-temperature laser scanning microscopy are described.
No takes yet. Share an insight, caveat, or question.
I. M. Dmitrenko (1996) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: