In this paper we present an absolute surface topography measurement with a tuneable diode laser with an external cavity that has a tuning range of as much as 25 nm without mode hops and a very high tuning speed of less than 1 s for the whole range. With this laser, an absolute wavelength-shift speckle pattern interferometer was realized, capable of measuring optically smooth and rough surfaces. We briefly explain the principles of operation, and the importance of wavelength tuning without mode hops. We discuss the capabilities, possible measuring ranges and some results as well as calibration methods of wavelength-shift speckle profilometry.
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Tiziani et al. (1997) studied this question.
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