Raman scattering as a compositional probe of II-VI ternary semiconductor nanocrystals

We show how Raman optic-mode peak positions and relative intensities can be used in a straightforward way to determine crystallite composition in CdSxSe1−x nanocrystals embedded in glass. These Raman techniques are particularly useful for low-concentration or small-crystallite-size composites where x-ray diffraction is not a viable technique for structural characterization of crystallites.