Answers are grounded in this paper and cite their sources.
Current-voltage characteristics of La-Sr-Cu-O(LSCO)/Al contacts have been measured. The results imply that the dominant conduction mechanism is Schottky emission, and that an insulating layer exists between the LSCO and the aluminum. The thickness and the relative dielectric constant of the layer have been estimated to be 25 nm and 7.5 respectively from its capacitance and the slope of the current-voltage plot.
No takes yet. Share an insight, caveat, or question.
Takeuchi et al. (1987) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: