Synapse
⌘+K
Synapse
PulseExploreClubsResearchersJournals
Instagram
HomeClubsExplore
April 17, 2009Nano Letters

Focused Electron-Beam-Induced Deposition of 3 nm Dots in a Scanning Electron Microscope

View Full Paper
Ask AI
Bookmark
Share

Authors

LKLeon van KouwenAmsterdam University of Applied SciencesABAurélien BotmanThermo Fisher Scientific (United States)KHK. HAGENDelft University of Technology

Discussion

Loading...

Member takes

Implication

Key Points

Key points are not available for this paper at this time.

Cite This Study

Kouwen et al. (2009) studied this question.

synapsesocial.com/papers/6a8b9fa5f8241cb45bfb61fehttps://doi.org/10.1021/nl900717r
View Full Paper
Ask AI
Bookmark
Share

Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Editorial: 50 Years of X-ray Mapping2006 · 17 citations
  2. 2Electron-beam-induced deposition using a subnanometer-sized probe of high-energy electrons2003 · 117 citations
  3. 3Formation and thermal stability of sub-10-nm carbon templates on Si(100)2004 · 35 citations
  4. 4Growth behavior near the ultimate resolution of nanometer-scale focused electron beam-induced deposition2008 · 50 citations
  5. 5In situ monitoring and control of material growth for high resolution electron beam induced deposition2007 · 7 citations