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November 15, 1967Physical Review

Electrical Studies of Neutron-Irradiated n -Type Si: Defect Structure and Annealing

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synapsesocial.com/papers/6a8bddce210b9ed19c898197https://doi.org/10.1103/physrev.163.801
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  1. 1Evidence for Damage Regions in Si, GaAs, and InSb Semiconductors Bombarded with High-Energy Neutrons1967 · 42 citations
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