Answers are grounded in this paper and cite their sources.
High-temperature x-ray diffraction measurements on HgTe-CdTe superlattices grown by molecular beam epitaxy have been made to determine the extent of intermixing of the individual HgTe and CdTe layers. In situ interdiffusion measurements were carried out at 110, 162, and 185 °C and estimates of the interdiffusion coefficient were made. We find appreciable intermixing of the HgTe and CdTe layers at temperatures as low as 110 °C. Such results have serious implications for the use of this material in optoelectronic devices.
No takes yet. Share an insight, caveat, or question.
Arch et al. (1986) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: