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A rapid method is described for aligning a double-crystal diffractometer based on the design of Hart (Characterization of Crystal Growth Defects by X-ray Methods, edited by Tanner & Bowen, pp. 483–485. Plenum Press, London, 1980). The theoretical intensity profiles are derived for variations in crystal tilt and rotation, and a method is described that uses these profiles to align any double-crystal diffractometer in a systematic way, suitable for computer automation. The alignment requirements for simple mismatch measurements are also given.
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Paul F. Fewster (1985) studied this question.
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