Probing of Gunn Effect Domains With a Scanning Electron Microscope

The high-field domains in a Gunn effect diode operating in the transit-time mode have been probed with a pulsed electron beam in a scanning electron microscope. The collected secondary emission current, when plotted as a function of both time and distance, clearly shows the propagation from cathode to anode of a region of high electric field. The probing technique is shown to offer micron spatial and subnanosecond temporal resolution.