Answers are grounded in this paper and cite their sources.
The weak-beam technique of electron microscopy (Cockayne, Ray and Whelan 1969) has been used to study constrictions found on extended dislocation lines in a copper-silicon alloy. The nature of these constrictions has been determined using in situ heating of the alloy.
No takes yet. Share an insight, caveat, or question.
Carter et al. (1974) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: