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A new design is described for a scanning tunneling microscope intended for surface science studies. The performance of the microscope is evaluated from tunneling images obtained of the Si(111) 7×7 surface. Periodic structures, point defects, and grain boundary structures are observed with atomic-scale resolution and are discussed. Illustrations of various types of image processing and data display are presented.
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Demuth et al. (1986) studied this question.
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