Selected-area electron spectrometry in the transmission electron microscope

The adaptation of an electron spectrometer to a transmission electron microscope affords another technique for the electron-optical study of materials, namely, selected-area electron spectrometry. A simple magnetic electron spectrometer, below the camera chamber of a transmission electron microscope, has been used in several preliminary applications, including evaluation of the H.T. supply of the electron microscope, measurement of specimen thickness, recording of electron diffraction patterns, studies of the angular distribution of energy loss electrons and microanalysis based on characteristic energy losses.