Modulated shear–force distance control in near-field scanning optical microscopy

The tip–sample distance in near-field scanning optical microscopy is typically controlled by the shear–force interaction between the laterally vibrating tip and sample. In this article, a mode of shear-force feedback is described in which an additional vertical modulation is introduced. Similar to the tapping mode applied in atomic force microscopy, the modulated shear–force technique deals with problem due to the snap to contact and therefore improves the mapping of soft and ductile materials, such as biological samples and soft polymers. The imaging properties of the modulated shear–force mode is demonstrated on structures of a soft polymer blend. Additionally, the modulated shear–force technique allows a simple comparison between effects in the optical far field and in the optical near field.