Electromagnetic random field models for analysis of coupling inside mode tuned chambers

The statistics of interference sources, induced by the electromagnetic fields of a mode tuned chamber (MTC), in electronic equipment is computed from the field's spatial covariance operator and a deterministic current distribution on the system under test. An example shows that the computed results, obtained with two canonical random field models, compare very well with measurements. In addition, a new and interesting relation between the variances of two-port S-parameters is established, which can be used to detect bad stirring in MTC.