The X-Ray Decomposition of Nitrous Oxide

The ion yield for the decompositiou of N/sub 2/O by x rays has been investigated at 50, 200, and 555 mm of pressure at extremely low intensities by the direct method. The effect of changes in pressure and in applied electric field have been studied. The reactions between the products NO and O/sub 2/ were not measurable at room temperature but proceeded immediately when a trap was immersed in liquid nitrogen to solidify the N/sub 2/O. By means of these reactions it was possible to determine the relative amounts of the products formed and hence the amount of N/sub 2/O decomposed per ion pair. The N/sub 2/O ion yield was 4.85 molecules decomposed per ion pair at 555 and 200 mm, but increased to 6.87 as the pressure was lowered to 50 mm. This increase was due to an ion recombination-induced reaction not important at the higher pressures. The yield of O/sub 2/ was about 1.3 and was uot significantly affected by pressure or by an electric field. The NO yield, however, was greater at 50 mm 14.271 than at the higher pressures (2.24) and was increased by the application of strong electric fields. The mechanisms were discussed. (auth)