We developed a new method of numerical simulation for noncontact atomic force microscopy (nc-AFM) images. This method works as a mapping filter from the tip-surface interaction force into the nc-AFM images. First we present a new method for image simulations. Next we apply this method to the simulation of nc-AFM images of a Si(111) 7 ×7 reconstructed surface. Thus it is determined that our method works well as an image simulator.
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Sasaki et al. (1999) studied this question.
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