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May 1, 1972IBM Journal of Research and Development

An Application of White Light Interferometry in Thin Film Measurements

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Authors

CLChia-Cheng LinNational Taipei University of TechnologyRSRobert F. SullivanRutgers, The State University of New Jersey

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Cite This Study

Lin et al. (1972) studied this question.

synapsesocial.com/papers/6a8da8dddafbba8333315925https://doi.org/10.1147/rd.163.0269
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