Structure of Fast Ion Conducting and Semiconducting Glassy Chalcogenide Alloys

The method of isotopic substitution in neutron diffraction is used to measure the metal-metal partial structure factor SMM(k) for the glassy fast ion conductor g-Ag₂As₃Se₄ and for the glassy semiconductor g-Cu₂As₃Se₄. The remaining partial structure factors are hence separated into two functions which comprise either the M-μ(μ=AsorSe) or μ-μ species. It is found that the short range order of the network former g-AsSe is not destroying on alloying with M₂Se and that the most significant structural differences occur with respect to the M atom ordering.