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Experimental study demonstrates enhanced infrared detectivity in BP/MoS2 photodiodes using refractive microlenses, highlighting practical near-infrared computational imaging.
The van der Waals materials have emerged as promising candidates for infrared (IR) photodetectors. Among these, black phosphorus (BP)/ molybdenum disulphide (MoS 2 ) photodiodes have shown high specific detectivity at room‐temperature. The signal‐to‐noise performance of such detectors can be further improved by employing a microlens to increase the total photon collection without changing the device size, and hence its noise current. In this study, we explore the direct integration of refractive microlenses on BP/MoS 2 photodiodes, designed for operation at a wavelength of λ = 1.55 µm. The device's photoresponse is enhanced by up to 20× after microlens fabrication, enabling a detectivity of 1.83 × 10 9 cmHz 1/2 W −1 under zero‐bias at room‐temperature. Infrared imaging is achieved by integrating the device into a single‐pixel imaging set‐up. This enables a 255 × 192‐pixel image to be resolved from the transmission of a binary mask placed in front of a λ = 1.55 µm light source. These results demonstrate that direct integration of refractive microlenses with van der Waals photodiodes provides a simple and scalable route to enhance detectivity at room‐temperature, enabling practical near‐infrared computational imaging.
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Vedaraj et al. (2026) studied this question.
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