Intensity Anomaly of Fluorescent X-Ray Emission Accompanying the Laue Case Reflection from a Perfect Crystal

Intensity change of the fluorescent X-rays accompanying the Laue case reflection from perfect germanium crystals was observed together with intensity profiles of diffracted and transmitted beams, using a double-crystal spectrometer. Observation was made on the intensity variations of K α and K β fluorescent X-rays with rotation of the crystals through the 220 reflection region and with increasing thickness of the crystals. The result showed a behaviour which can be explained in terms of the formation of two types of standing-wave fields of X-rays in the crystals and the Borrmann effect. The obtained results were compared with a theoretical calculation.