Tapping-mode Atomic Force Microscopy and synchrotron X-ray scattering measurements on dotriacontane ( n -C 32 H 66 or C32) films adsorbed on SiO 2 -coated Si(100) wafers reveal a narrow temperature range near the bulk C32 melting point T b in which a monolayer phase of C32 molecules oriented perpendicular to surface is stable. This monolayer phase undergoes a delayering transition to a three-dimensional (3D) fluid phase on heating to just above T b and to a solid 3D phase on cooling below T b . An equilibrium phase diagram provides a useful framework for interpreting the unusual spreading and receding of the monolayer observed in transitions to and from the respective 3D phases.
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Bai et al. (2007) studied this question.
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