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July 24, 2003Journal of Applied PhysicsOpen Access

Correlated scanning Kelvin probe and conductive atomic force microscopy studies of dislocations in gallium nitride

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Authors

BSBlake S. SimpkinsUnited States Naval Research LaboratoryEYEdward T. YuStevens Institute of TechnologyPWPatrick WaltereitUniversity of California, Santa Barbara

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Simpkins et al. (2003) studied this question.

synapsesocial.com/papers/6a9035e3743786549a0415cahttps://doi.org/10.1063/1.1586952
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