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April 15, 1986Journal of Applied Physics

Computer simulation of high-resolution transmission electron microscopy images of Si/SiO2 interfaces

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Authors

IOIwao OhdomariWaseda UniversityTMTohru MiharaWaseda UniversityKKKazuhiko KaiWaseda University

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Cite This Study

Ohdomari et al. (1986) studied this question.

synapsesocial.com/papers/6a9037cb7b6e700e2c8a455dhttps://doi.org/10.1063/1.336959
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