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December 19, 2003Applied Physics Letters

Surface potential profiling and contact resistance measurements on operating pentacene thin-film transistors by Kelvin probe force microscopy

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Authors

KPKanan P. PuntambekarNorthwestern UniversityPPPaul V. PesaventoUniversity of MinnesotaCFC. Daniel FrisbieShepherd University

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Puntambekar et al. (2003) studied this question.

synapsesocial.com/papers/6a90399ce02ba012352da680https://doi.org/10.1063/1.1637443
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