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We report the direct observation of electromigration and induced stress in the Cu nanowire. During the electromigration, the decrease in pulling stress in the nanowire is observed with the modification of the nanowire. When the nanowire reaches the stable state, the single crystal lattice of Cu appears in the nanowire. This suggests that electromigration could be used as method of a annealing of the nanowire.
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Fujisawa et al. (2003) studied this question.
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