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We propose a simple symmetry based optical technique for the measurement of the azimuthal anchoring energy of nematic liquid crystals on solid substrates. It can be applied even in the case of strong anchoring and for arbitrarily large surface director deviations. The proposed technique is applied to measure the azimuthal anchoring energy of the nematic 5CB on obliquely evaporated SiO layers.
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Pqlossat et al. (1996) studied this question.
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