Demonstration of Advanced Timing Schemes in Time-Resolved X-ray Diffraction Measurements

High Resolution Image Download MS PowerPoint Slide We present time-resolved X-ray diffraction measurements using advanced timing schemes that provide high temporal resolution while also maintaining a high flux in the X-ray probe beam. The method employs on–off patterned probe pulse sequences that are generated with the WaveGate solid-state pulse picker. We demonstrate the feasibility of our method at two different beamlines on millisecond and microsecond time scales.