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By exploiting tapping mode atomic force microscopy, the moisture-induced degradation mechanisms of ITO (indium tin oxide)-coated glass/CuPc (copper phthalocyanine)/NPB ( N , N '-di(naphthalene-1-yl)- N , N '-diphthalbenzidine)/Alq 3 (tris(8-hydroxyquinoline) aluminium)-based organic light-emitting diodes without cathode were investigated. It is found that three types of degradation mechanisms are associated with moisture-exposed Alq 3 films, when the device is exposed to moisture, namely, hydration of Alq 3 , crystallization of Alq 3 and reaction of the Alq 3 complex with H 2 O. Crystallization of the NPB layer of ITO/CuPc/NPB was observed on exposure to moisture, and de-wetting simultaneously takes place at the interface of CuPc/NPB. Indium and/or oxygen may diffuse from ITO into the organic layers. These observations provide a clear picture of the moisture-induced degradation mechanisms of the ITO/CuPc/NPB/Alq 3 -based OLEDs.
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Xu et al. (2004) studied this question.
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