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This paper presents a new sine-wave fitting procedure for characterizing data acquisition channels and analog-to-digital converters. It overcomes most of the problems encountered with the classical three- or four-parameter sine-wave fitting procedure described in IEEE Standard 1057. The stochastic properties of the new procedure are thoroughly analyzed. Its performance is illustrated by simulations and measurements with a high-frequency sampling scope.
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Pintelon et al. (1996) studied this question.
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