Charge Yield and Track Structure Effects on Total Ionizing Dose Measurements

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An experimental study of the charge yield of gamma and alpha radiation sources is presented. A Monte-Carlo simulation, which follows each electron to thermal energy and does not resort to geminate or columnar models, is applied to explain the experimental results. Implications of charge yield and heavy ion track structure on total ionizing dose measurements using MOSFET dosimeters are discussed, and the effect of the angle of incidence of the ion on the charge yield is addressed.