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ZnSe films were grown on GaAs substrates by gas source molecular beam epitaxy using metal Zn and H2Se as sources. H2Se was thermally cracked in a high pressure gas cell. The effects of growth temperature, VI/II ratio and H2Se cracking temperature on ZnSe growth were investigated. Under the condition where the cracked- H2Se flux controlled the growth rate, ZnSe films with smooth surface morphology were obtained at growth temperatures between 250 and 410° C. With increasing cracked- H2Se flux and/or H2Se cracking temperature, facets emerged on the growing surface and surface morphology was degraded.
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Imaizumi et al. (1994) studied this question.
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