We report a study of the optical near field of an active integrated component operating near the 1.55-mum telecommunications wavelength. The device is based on a two-dimensional photonic crystal etched in a suspended InP membrane. Topographic as well as optical information is collected by use of a scanning near-field optical microscope in collection mode, providing information about the local distribution of the losses.
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Gérard et al. (2002) studied this question.
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