Differentiating between long and short range disorder in infra-red spectra: on the meaning of “crystallinity” in silica

peak could be used to assess local atomic disorder as it does not show scattering and peak shape changes when absorption effects dominate, below 2 μm. We propose coupling particle size assessments with infra-red peak shape analysis as a method to characterize crystallinity and short range order for studying recrystallization in natural silica, as well as defectivity in many different types of silicas used for industrial and technological applications.