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Motivated by recent experiments on current induced step bunching on Si(111) surfaces, we study a generalized 2D Barton-Cabrera-Franck model, where adatoms have a diffusion bias parallel to the step edges and there is an attachment barrier at the step edge. We find a new linear instability with novel step patterns. Monte Carlo simulations on a solid-on-solid model are used to study the instability beyond the linear regime.
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Liu et al. (1998) studied this question.
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