Answers are grounded in this paper and cite their sources.
The reliability of InP/InGaAs uni-travelling-carrier photodiodes has been studied. A failure rate of 42 FIT at 25°C was estimated from long-term bias-temperature stress tests. Stable operations for over 2000 h were also confirmed under higher-power optical input conditions.
No takes yet. Share an insight, caveat, or question.
Furuta et al. (2002) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: