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A technique for characterising the 3rd-order intermodulationdistortion properties of GaAs f.e.t.s as a function of the load admittance presented to the output of the device is described. These properties can be determined for virtually any load admittance, including a purely reactive termination. A practical f.e.t example is included for illustration.
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Rauscher et al. (1977) studied this question.
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