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High electric fields are known to irreversibly reduce the out-of-plane tilt of the chevron layers in ferroelectric liquid crystal (FLC) devices. This paper reports a dynamic x-ray study of field driven structural layer changes in a ∼4μm thick FLC device containing the liquid crystal SCE13. The applied voltage and duration of application were varied and the chevron structure evaluated before and after application of the field. Results are discussed with respect to feasible layer configurations that may occur during high field treatment of the device.
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Bryant et al. (1998) studied this question.
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