What question did this study set out to answer?

To determine the crystallographic surface polarity of c-axis oriented wurtzite-type zinc oxide epitaxial films grown on sapphire substrates.

February 16, 1998Applied Physics LettersOpen Access

Determination of surface polarity of c-axis oriented ZnO films by coaxial impact-collision ion scattering spectroscopy

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Authors

TOTsuyoshi OhnishiNational Institute for Materials Science AOAkira OhtomoTokyo Institute of Technology MKM. KawasakiUniversity of Geneva

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Overview

Spectroscopic analysis reveals oxygen-face termination in c-axis zinc oxide films on sapphire, highlighting preferential growth driven by interface chemistry and sublimation stability.

Key Points

To determine the crystallographic surface polarity of c-axis oriented wurtzite-type zinc oxide epitaxial films grown on sapphire substrates.
Synthesized zinc oxide epitaxial films on sapphire (α-Al2O3) (0001) substrates via laser molecular beam epitaxy using a zinc oxide ceramic target.
Identified top surface termination using coaxial impact-collision ion scattering spectroscopy by directly comparing film spectra with bulk single-crystal reference faces.
Spectroscopic data showed that the top surface of the epitaxial film terminates exclusively with the oxygen-polar (0001̄) crystallographic plane.
Identified that the preferential [0001̄] growth direction is driven by interfacial chemical interactions with the substrate and enhanced surface stability against thermal sublimation.

Cite This Study

Ohnishi et al. (1998) studied this question.

synapsesocial.com/papers/6a9134e45ec22faf44c64f44 https://doi.org/10.1063/1.120905

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February 16, 1998Applied Physics LettersOpen Access

Determination of surface polarity of c-axis oriented ZnO films by coaxial impact-collision ion scattering spectroscopy

View Full Paper

Ask AI

Bookmark

Authors

TOTsuyoshi OhnishiNational Institute for Materials Science AOAkira OhtomoTokyo Institute of Technology MKM. KawasakiUniversity of Geneva

Discussion

Member takes

Overview

Spectroscopic analysis reveals oxygen-face termination in c-axis zinc oxide films on sapphire, highlighting preferential growth driven by interface chemistry and sublimation stability.

Key Points

To determine the crystallographic surface polarity of c-axis oriented wurtzite-type zinc oxide epitaxial films grown on sapphire substrates.
Synthesized zinc oxide epitaxial films on sapphire (α-Al2O3) (0001) substrates via laser molecular beam epitaxy using a zinc oxide ceramic target.
Identified top surface termination using coaxial impact-collision ion scattering spectroscopy by directly comparing film spectra with bulk single-crystal reference faces.
Spectroscopic data showed that the top surface of the epitaxial film terminates exclusively with the oxygen-polar (0001̄) crystallographic plane.
Identified that the preferential [0001̄] growth direction is driven by interfacial chemical interactions with the substrate and enhanced surface stability against thermal sublimation.

Cite This Study

Ohnishi et al. (1998) studied this question.

synapsesocial.com/papers/6a9134e45ec22faf44c64f44 https://doi.org/10.1063/1.120905

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