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We have measured the electron-energy-loss rate in an n-doped GaAs-AlₓGa_1-xAs heterostructure by finding the power required to establish a steady-state temperature offset between the electrons and the lattice. The measurement utilizes the temperature dependence of the resistance as a self-thermometer; heat is injected by an additional dc current. We find that for our sample the energy relaxation rate below 1 K is τ_ε^-1=(2.5×10⁶)T³ sec^-1 K^-3.
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Wennberg et al. (1986) studied this question.
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