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April 1, 1963Philosophical magazine

Current-voltage characteristics of the helium field-ion microscope

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MSM.J. SouthonUniversity of CambridgeDBD. G. BrandonNational Institute of Standards and Technology

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Southon et al. (1963) studied this question.

synapsesocial.com/papers/6a913dfd34ac07881f6f20adhttps://doi.org/10.1080/14786436308211157
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Also Consider

Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context:

  1. 1Determination of Field Strength for Field Evaporation and Ionization in the Field Ion Microscope1961 · 62 citations
  2. 2Resolution of the Atomic Structure of a Metal Surface by the Field Ion Microscope1956 · 186 citations
  3. 3Characteristics of the Bayard-Alpert Ionization Gauge at Pressures above 10−5 mm Hg1957 · 60 citations
  4. 4Study of Atomic Structure of Metal Surfaces in the Field Ion Microscope1957 · 116 citations
  5. 5Experimental Measurement of the Total-Energy Distribution of Field-Emitted Electrons1959 · 117 citations