Answers are grounded in this paper and cite their sources.
Review: Two‐dimensional information on the microstructure of materials at a resolution comparable to interatomic distances is crucial for the study of interfaces, defects, growth mechanisms etc. One of the most important analytical methods for gaining such information is high‐resolution electron microscopy (HREM). The interpretation of the results on semiconductors, magnetic alloys and multilayers, can often be facilitated through image processing and simulation.
No takes yet. Share an insight, caveat, or question.
Bulle‐Lieuwma et al. (1991) studied this question.
Synapse has enriched 10 related papers. Consider them for comparative context: