The increase of the surface resistance of plane copper surfaces caused by mechanically generated surface roughness has been determined at 35 GHz by measuring and evaluating the Q values of an H-guide cavity with removable sidewalls. The sidewalls were ground one-directionally by using abrasive papers of various grades to produce various degrees of roughness. The rms values of roughess were measured mechanically and optically after calibration by microphotography.
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F.J. Tischer (1974) studied this question.
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