A method for experimentally selecting proper silicon-on-insulator MOSFET models for circuit simulation is described, verified, and demonstrated. The selection criteria are derived from steady-state current-voltage characteristics predicted by thin-film and (semi-)bulk models. The necessity for proper model selection is emphasized by revealing significant simulation errors that result from seemingly valid but actually empirical models.>
No takes yet. Share an insight, caveat, or question.
Fossum et al. (1988) studied this question.
Synapse has enriched 5 closely related papers on similar clinical questions. Consider them for comparative context: