Identification and quantitative characterization of antiparallel domains using an interferometric method

We present a method to identify antiparallel domains through the use of an optical interferometric technique. In contrast to etching techniques, this method is nondestructive and provides a quantitative measure of the linear electro-optic coefficient. Comparisons with the etching technique show that the two methods are in good agreement. This interferometric technique can be generalized to identify other types of domain structures as well.