A Structural Study of Co-Sb Multilayered Film by X-Ray Diffraction

The structure of a multilayered film, [Co(30 Å)-Sb(25 Å)]70, prepared by vacuum deposition is investigated by using mainly X-ray diffraction. It is revealed that the Co layer has a hcp structure with [110] texture while the Sb layer does not show any distinct texture. The relative intensities and the line width of Bragg reflections are interpreted on the assumption of a very thin compound layer at each interface and also a small distribution of Sb layer thickness. Preliminary results from electron microscopic analyses are also briefly introduced.