The present study continues the work described in Part I of this paper in utilizing a specifically designed apparatus for generating a known near-wall fluctuating flow field for the purpose of quantifying the dynamic response of a flush-mounted hot-element wall shear stress gauge. Two different types of wall shear stress gauges were tested: a flush-mounted hot wire in contact with the wall substrate and commercially available quartz substrate hot-film gauges with different thicknesses of quartz coating. It is found that the flush-mounted hot-wire gauge has a much higher dynamic response than the quartz substrate gauges, although it is still lower than the marginally elevated hot-wire configuration. This may suggest the possible use of a marginally elevated hot wire as a wall shear stress gauge to ensure sufficient responsiveness for time-resolved wall shear stress measurements.
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Chew et al. (1998) studied this question.
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