Get PDF Email Share Share with Facebook Tweet This Post on reddit Share with LinkedIn Add to CiteULike Add to Mendeley Add to BibSonomy Get Citation Copy Citation Text Jerry Edelstein, Michael C. Hettrick, Stanley Mrowka, Patrick Jelinsky, and Christopher Martin, "Extreme UV measurements of a varied line-space Hitachi reflection grating: efficiency and scattering," Appl. Opt. 23, 3267_1-3270 (1984) Export Citation BibTex Endnote (RIS) HTML Plain Text Citation alert Save article
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Edelstein et al. (1984) studied this question.
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